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Phase-noise-driven instability in a single-mode microchip Nd : YVO4 laser with feedback

dc.citation.epage1225en_US
dc.citation.issue9en_US
dc.citation.spage1215en_US
dc.citation.volume37en_US
dc.citation.woscount8
dc.contributor.authorLim, TSen_US
dc.contributor.authorYang, THen_US
dc.contributor.authorChern, JLen_US
dc.contributor.authorOtsuka, Ken_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:43:30Z
dc.date.available2014-12-08T15:43:30Z
dc.date.issued2001-09-01en_US
dc.description.abstractWe report the instability behaviors of a single-mode microchip solid-state laser subjected to external feedback. Two kinds of instabilities, random chaotic burst generations and random sinusoidal burst generations, were observed experimentally in an LD-pumped microchip Nd:YVO4 single-mode solid-state laser with fiber feedback. These results are totally different form those observed in laser diodes with delay feedback systems, which have been widely studied in last decades. Main features were reproduced numerically by utilizing the Lang-Kobayashi equations with phase noise, indicating phase-noise-driven dynamic instabilities.en_US
dc.identifier.doi10.1109/3.945328en_US
dc.identifier.issn0018-9197en_US
dc.identifier.journalIEEE JOURNAL OF QUANTUM ELECTRONICSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/3.945328en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/29440
dc.identifier.wosnumberWOS:000170752900015
dc.language.isoen_USen_US
dc.subjectlaser stabilityen_US
dc.subjectneodymiumen_US
dc.subjectnumerical analysisen_US
dc.subjectoptical feedbacken_US
dc.subjectphase noiseen_US
dc.subjectsolid lasersen_US
dc.subjectstochastic differential equationsen_US
dc.titlePhase-noise-driven instability in a single-mode microchip Nd : YVO4 laser with feedbacken_US
dc.typeArticleen_US

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