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Analysis of diffusive interface resistance for measurements with perpendicular current in Fe/Nb multilayers

dc.citation.epageen_US
dc.citation.issue8en_US
dc.citation.volume99en_US
dc.citation.woscount0
dc.contributor.authorHuang, S. Y.en_US
dc.contributor.authorLee, S. F.en_US
dc.contributor.authorYu, C. Y.en_US
dc.contributor.authorHsu, S. Y.en_US
dc.contributor.authorYao, Y. D.en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:16:49Z
dc.date.available2014-12-08T15:16:49Z
dc.date.issued2006-04-15en_US
dc.description.abstractIn this study, we investigated the electron transport properties of interface between a ferromagnet and a superconductor with flowing current perpendicular to plan (CPP) at 4.2 K in Fe/Nb multilayers. The CPP resistance increased linearly with layer thickness and with bilayer number. We extracted the unit area resistance value of one pair of interface for superconducting and normal Fe/Nb by using a series resistor model. Hence, we can quantitatively analyze the interface resistance between Fe and Nb in the diffusive regime. (C) 2006 American Institute of Physics.en_US
dc.identifier.doi10.1063/1.2176871en_US
dc.identifier.issn0021-8979en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2176871en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/12365
dc.identifier.wosnumberWOS:000237404200549
dc.language.isoen_USen_US
dc.titleAnalysis of diffusive interface resistance for measurements with perpendicular current in Fe/Nb multilayersen_US
dc.typeArticleen_US

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