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CURRENT MULTIPLICATION IN MIS STRUCTURES

dc.citation.epage11en_US
dc.citation.issue1en_US
dc.citation.spage1en_US
dc.citation.volume27en_US
dc.citation.woscount0
dc.contributor.authorCHEIN, WJen_US
dc.contributor.authorCHUNG, LLen_US
dc.contributor.authorTAN, FLen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:06:16Z
dc.date.available2014-12-08T15:06:16Z
dc.date.issued1984en_US
dc.identifier.issn0038-1101en_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4854
dc.identifier.wosnumberWOS:A1984SA94400001
dc.language.isoen_USen_US
dc.titleCURRENT MULTIPLICATION IN MIS STRUCTURESen_US
dc.typeArticleen_US

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