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TEMPERATURE-DEPENDENCE OF HYDROGEN IMPLANT ON PASSIVATION OF ARGON IMPLANT DAMAGE IN SILICON

dc.citation.epageL1319en_US
dc.citation.issue7en_US
dc.citation.spageL1317en_US
dc.citation.volume27en_US
dc.citation.woscount4
dc.contributor.authorCHIEN, HCen_US
dc.contributor.authorASHOK, Sen_US
dc.contributor.authorCHEN, MCen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:05:57Z
dc.date.available2014-12-08T15:05:57Z
dc.date.issued1988-07-01en_US
dc.identifier.issnen_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4506
dc.identifier.wosnumberWOS:A1988P978500051
dc.language.isoen_USen_US
dc.titleTEMPERATURE-DEPENDENCE OF HYDROGEN IMPLANT ON PASSIVATION OF ARGON IMPLANT DAMAGE IN SILICONen_US
dc.typeArticleen_US

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