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Influence of measuring environment on the electrical characteristics of pentacene-based thin film transistors

dc.citation.epage219en_US
dc.citation.issue1-2en_US
dc.citation.spage215en_US
dc.citation.volume467en_US
dc.citation.woscount35
dc.contributor.authorWang, YWen_US
dc.contributor.authorCheng, HLen_US
dc.contributor.authorWang, YKen_US
dc.contributor.authorHu, THen_US
dc.contributor.authorHo, JCen_US
dc.contributor.authorLee, CCen_US
dc.contributor.authorLei, TFen_US
dc.contributor.authorYeh, CFen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:37:17Z
dc.date.available2014-12-08T15:37:17Z
dc.date.issued2004-11-22en_US
dc.description.abstractThis work concerns the electrical properties and carrier transport behavior of polycrystalline pentacene-based thin film transistors (TFTs) in air and high-vacuum environments. The transistor in a high vacuum outperforms that in air. The dependence of the field-effect mobility on the gate voltage and the drain voltage is considered. A potential barrier model is applied to estimate the trap density of the pentacene transistor. The determined trap density at the grain boundaries of the pentacene film in air exceeds that in a high vacuum. These results show that the increased trap concentration at the grain boundaries in ambient air limits carrier transport. (C) 2004 Elsevier B.V. All rights reserved.en_US
dc.identifier.doi10.1016/j.tsf.2004.04.001en_US
dc.identifier.issn0040-6090en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.tsf.2004.04.001en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/25628
dc.identifier.wosnumberWOS:000224185100036
dc.language.isoen_USen_US
dc.subjectorganic semiconductorsen_US
dc.subjectelectronic devicesen_US
dc.subjectelectrical properties and measurementsen_US
dc.titleInfluence of measuring environment on the electrical characteristics of pentacene-based thin film transistorsen_US
dc.typeArticleen_US

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