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Nanostructure patterns written in polycarbonate by a bent optical fiber probe

dc.citation.epage2300en_US
dc.citation.issue6en_US
dc.citation.spage2299en_US
dc.citation.volume19en_US
dc.citation.woscount1
dc.contributor.authorChen, SHen_US
dc.contributor.authorChen, YFen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:43:18Z
dc.date.available2014-12-08T15:43:18Z
dc.date.issued2001-11-01en_US
dc.description.abstractAn atomic force, microscope operated in tapping mode using a homemade bent optical fiber probe was used to pattern nanometer-scale features. Trenches of different dimensions were written on polycarbonate that was pre-exposed to an excimer laser. Lines with widths varying from 260 to 600 nm and depths ranging from 30 to 120 nm have been made. The present technique as a complementary tool to other lithographic processes has been demonstrated to be potentially suitable for low-cost and high-precision applications. (C) 2001 American Vacuum Society.en_US
dc.identifier.doi10.1116/1.1421555en_US
dc.identifier.issn1071-1023en_US
dc.identifier.journalJOURNAL OF VACUUM SCIENCE & TECHNOLOGY Ben_US
dc.identifier.urihttp://dx.doi.org/10.1116/1.1421555en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/29302
dc.identifier.wosnumberWOS:000173159900049
dc.language.isoen_USen_US
dc.titleNanostructure patterns written in polycarbonate by a bent optical fiber probeen_US
dc.typeArticleen_US

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