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Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

dc.citation.epage835en_US
dc.citation.issue15en_US
dc.citation.spage834en_US
dc.citation.volume41en_US
dc.citation.woscount0
dc.contributor.authorChang, MFen_US
dc.contributor.authorChiou, LYen_US
dc.contributor.authorWen, KAen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:18:44Z
dc.date.available2014-12-08T15:18:44Z
dc.date.issued2005-07-21en_US
dc.description.abstractA dynamic bitline shielding (DBS) technique is proposed for highspeed via-programming ROMs, to eliminate code-pattem-dependent crosstalk-induced read failure (CIRF) and increase code-pattem coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.en_US
dc.identifier.doi10.1049/el:20051738en_US
dc.identifier.issn0013-5194en_US
dc.identifier.journalELECTRONICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1049/el:20051738en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/13476
dc.identifier.wosnumberWOS:000233419800003
dc.language.isoen_USen_US
dc.titleCode-pattern insensitive embedded ROMs using dynamic bitline shielding techniqueen_US
dc.typeArticleen_US

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