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Critical point defect detection for small-pixel thin-film transistor array applied to medical display

dc.citation.epage380en_US
dc.citation.issue9en_US
dc.citation.spage376en_US
dc.citation.volume21en_US
dc.citation.woscount2
dc.contributor.authorWang, Yao-Chinen_US
dc.contributor.authorLin, Bor-Shyhen_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department影像與生醫光電研究所zh_TW
dc.contributor.department生醫電子轉譯研究中心zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentInstitute of Imaging and Biomedical Photonicsen_US
dc.contributor.departmentBiomedical Electronics Translational Research Centeren_US
dc.date.accessioned2014-12-08T15:34:52Z
dc.date.available2014-12-08T15:34:52Z
dc.date.issued2013-09-01en_US
dc.identifier.doi10.1002/jsid.195en_US
dc.identifier.issn1071-0922en_US
dc.identifier.journalJOURNAL OF THE SOCIETY FOR INFORMATION DISPLAYen_US
dc.identifier.urihttp://dx.doi.org/10.1002/jsid.195en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/23727
dc.identifier.wosnumberWOS:000331208900002
dc.language.isoen_USen_US
dc.titleCritical point defect detection for small-pixel thin-film transistor array applied to medical displayen_US
dc.typeArticleen_US

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