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Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor

dc.citation.epage656en_US
dc.citation.issue5en_US
dc.citation.spage649en_US
dc.citation.volume52en_US
dc.citation.woscount0
dc.contributor.authorTai, Ya-Hsiangen_US
dc.contributor.authorHuang, Shih-Cheen_US
dc.contributor.authorSu, Ko-Chingen_US
dc.contributor.authorTseng, Chen-Yehen_US
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentInstitute of Displayen_US
dc.date.accessioned2014-12-08T15:12:16Z
dc.date.available2014-12-08T15:12:16Z
dc.date.issued2008-05-01en_US
dc.description.abstractThe application of the capability of low-temperature poly-Si TFT circuits for high resolution X-ray active matrix sensor is explored. The integration of poly-Si TIFT circuits oil the glass enables an easy connection for the sensor array with fine pixel pitch. A novel charge sensitive amplifier circuit employing poly-Si TFTs is proposed for the readout system of the active matrix sensor. It can considerably increase the circuit's immunity to the unavoidable threshold voltage variations of the poly-Si TFTs.. The V-TH mismatch effect of the TFTs, which results in the offset voltage of the charge amplifier, can also be suppressed by the proposed circuit. However, the noise arisen from the V-TH mismatch can be even larger than that from the V-TH variation after compensation. It reflects that, for higher bit digital X-ray image sensors, the mismatch effect of the devices must be properly taken into consideration. (c) 2007 Elsevier Ltd. All rights reserved.en_US
dc.identifier.doi10.1016/j.sse.2007.12.005en_US
dc.identifier.issn0038-1101en_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.sse.2007.12.005en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/9428
dc.identifier.wosnumberWOS:000255581000009
dc.language.isoen_USen_US
dc.subjectcharge sensitive amplifieren_US
dc.subjectpoly-Si TFTsen_US
dc.subjectX-ray active matrix sensoren_US
dc.titleVariation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensoren_US
dc.typeArticleen_US

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