Growth of lattice-matched InAlN/GaN on Si (111) substrate for ultraviolet photodiode application
| dc.citation.epage | 708 | en_US |
| dc.citation.issue | 5 | en_US |
| dc.citation.spage | 705 | en_US |
| dc.citation.volume | 9 | en_US |
| dc.citation.woscount | 1 | |
| dc.contributor.author | Binh Tinh Tran | en_US |
| dc.contributor.author | Chang, Edward Yi | en_US |
| dc.contributor.department | 材料科學與工程學系 | zh_TW |
| dc.contributor.department | Department of Materials Science and Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:32:30Z | |
| dc.date.available | 2014-12-08T15:32:30Z | |
| dc.date.issued | 2013-09-01 | en_US |
| dc.description.abstract | In this paper, we report on the growth of high quality In (x) Al1-x N/GaN hetero-structures on Si substrate by metal organic chemical vapor deposition with various indium compositions (x = 10.2, 16.2 and 17.6%). The lattice-matched In0.176Al0.838N/GaN structure shows a smooth surface with good crystalline quality. In addition, the ultraviolet photodiode device shows excellent device characteristics with a low leakage current of 0.12 A mu A, and a high spectral response. It has good quantum efficiency of 94 mA/W and 44% at 265 nm which is comparable to that of the InAlN photodiode grown on sapphire substrate. | en_US |
| dc.identifier.doi | 10.1007/s13391-013-2254-8 | en_US |
| dc.identifier.issn | 1738-8090 | en_US |
| dc.identifier.journal | ELECTRONIC MATERIALS LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1007/s13391-013-2254-8 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/22779 | |
| dc.identifier.wosnumber | WOS:000324112600025 | |
| dc.language.iso | en_US | en_US |
| dc.subject | InAlN | en_US |
| dc.subject | Si | en_US |
| dc.subject | photodiode | en_US |
| dc.subject | lattice-matched | en_US |
| dc.title | Growth of lattice-matched InAlN/GaN on Si (111) substrate for ultraviolet photodiode application | en_US |
| dc.type | Article | en_US |
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