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Instrument for x-ray absorption spectroscopy with in situ electrical control characterizations

dc.citation.epageen_US
dc.citation.issue12en_US
dc.citation.volume84en_US
dc.citation.woscount0
dc.contributor.authorHuang, Chun-Chaoen_US
dc.contributor.authorChang, Shu-Juien_US
dc.contributor.authorYang, Chao-Yaoen_US
dc.contributor.authorChou, Hsiungen_US
dc.contributor.authorTseng, Yuan-Chiehen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.date.accessioned2014-12-08T15:34:41Z
dc.date.available2014-12-08T15:34:41Z
dc.date.issued2013-12-01en_US
dc.description.abstractWe report a synchrotron-based setup capable of performing x-ray absorption spectroscopy and x-ray magnetic circular dichroism with simultaneous electrical control characterizations. The setup can enable research concerning electrical transport, element-and orbital-selective magnetization with an in situ fashion. It is a unique approach to the real-time change of spin-polarized electronic state of a material/device exhibiting magneto-electric responses. The performance of the setup was tested by probing the spin-polarized states of cobalt and oxygen of Zn1-xCoxO dilute magnetic semiconductor under applied voltages, both at low (similar to 20 K) and room temperatures, and signal variations upon the change of applied voltage were clearly detected. (C) 2013 AIP Publishing LLC.en_US
dc.identifier.doi10.1063/1.4849635en_US
dc.identifier.issn0034-6748en_US
dc.identifier.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4849635en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/23650
dc.identifier.wosnumberWOS:000329984100041
dc.language.isoen_USen_US
dc.titleInstrument for x-ray absorption spectroscopy with in situ electrical control characterizationsen_US
dc.typeArticleen_US

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