An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
| dc.citation.epage | 1349 | en_US |
| dc.citation.issue | 8 | en_US |
| dc.citation.spage | 1349 | en_US |
| dc.citation.volume | 43 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Pearn, WL | en_US |
| dc.contributor.author | Shu, MH | en_US |
| dc.contributor.department | 工業工程與管理學系 | zh_TW |
| dc.contributor.department | Department of Industrial Engineering and Management | en_US |
| dc.date.accessioned | 2014-12-08T15:40:33Z | |
| dc.date.available | 2014-12-08T15:40:33Z | |
| dc.date.issued | 2003-08-01 | en_US |
| dc.identifier.doi | 10.1016/S0026-2714(03)00187-2 | en_US |
| dc.identifier.issn | 0026-2714 | en_US |
| dc.identifier.journal | MICROELECTRONICS RELIABILITY | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/S0026-2714(03)00187-2 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/27681 | |
| dc.identifier.wosnumber | WOS:000184674500025 | |
| dc.language.iso | en_US | en_US |
| dc.title | An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003) | en_US |
| dc.type | Correction | en_US |