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Performance of GaN-based light-emitting diodes fabricated using GaN epilayers grown on silicon substrates

dc.citation.epageA187en_US
dc.citation.issue1en_US
dc.citation.spageA179en_US
dc.citation.volume22en_US
dc.citation.woscount1
dc.contributor.authorHorng, Ray-Huaen_US
dc.contributor.authorWu, Bing-Ruien_US
dc.contributor.authorTien, Ching-Hoen_US
dc.contributor.authorOu, Sin-Liangen_US
dc.contributor.authorYang, Min-Haoen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorWuu, Dong-Singen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:35:07Z
dc.date.available2014-12-08T15:35:07Z
dc.date.issued2014-01-13en_US
dc.description.abstractLight extraction of GaN-based light-emitting diodes grown on Si(111) substrate (GaN-on-Si based LEDs) is presented in this study. Three different designs of GaN-on-Si based LEDs with the lateral structure, lateral structure on mirror/Si(100) substrate, and vertical structure on mirror/Si(100) substrate were epitaxially grown by metalorganic chemical vapor deposition and fabricated using chemical lift-off and double-transfer techniques. Current-voltage, light output power, far-field radiation patterns, and electroluminescence characteristics of these three LEDs were discussed. At an injection current of 700 mA, the output powers of LEDs with the lateral structure on mirror/Si(100) substrate and vertical structure on mirror/Si(100) substrate were measured to be 155.07 and 261.07 mW, respectively. The output powers of these two LEDs had 70.63% and 187.26% enhancement compared to that of LED with the lateral structure, respectively. The result indicated this vertical structure LED was useful in improving the light extraction due to an enhancement in light scattering efficiency while the high-reflection mirror and diffuse surfaces were employed. (C) 2014 Optical Society of Americaen_US
dc.identifier.doi10.1364/OE.22.00A179en_US
dc.identifier.issn1094-4087en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.22.00A179en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/23840
dc.identifier.wosnumberWOS:000330579300009
dc.language.isoen_USen_US
dc.titlePerformance of GaN-based light-emitting diodes fabricated using GaN epilayers grown on silicon substratesen_US
dc.typeArticleen_US

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