THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS
| dc.citation.epage | 26 | en_US |
| dc.citation.issue | 1 | en_US |
| dc.citation.spage | 20 | en_US |
| dc.citation.volume | 17 | en_US |
| dc.contributor.author | LIU, YN | en_US |
| dc.contributor.author | LIU, CC | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.date.accessioned | 2014-12-08T15:06:23Z | |
| dc.date.available | 2014-12-08T15:06:23Z | |
| dc.date.issued | 1982-01-01 | en_US |
| dc.description.abstract | en_US | |
| dc.identifier.issn | 0018-9367 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON ELECTRICAL INSULATION | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4953 | |
| dc.language.iso | en_US | en_US |
| dc.title | THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS | en_US |
| dc.type | Article | en_US |
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