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Integrating a Hive Triangle Pattern with Subpixel Analysis for Noncontact Measurement of Structural Dynamic Response by Using a Novel Image Processing Scheme

dc.citation.woscount0
dc.contributor.authorLu, Yung-Chien_US
dc.contributor.authorHung, Shih-Linen_US
dc.contributor.authorLin, Tzu-Hsuanen_US
dc.contributor.department土木工程學系zh_TW
dc.contributor.departmentDepartment of Civil Engineeringen_US
dc.date.accessioned2014-12-08T15:36:10Z
dc.date.available2014-12-08T15:36:10Z
dc.date.issued2014en_US
dc.description.abstractThis work presents a digital image processing approach with a unique hive triangle pattern by integrating subpixel analysis for noncontact measurement of structural dynamic response data. Feasibility of proposed approach is demonstrated based on numerical simulation of a photography experiment. According to those results, the measured time-history displacement of simulated image correlates well with the numerical solution. A small three-story frame is then mounted on a small shaker table, and a linear variation differential transformation (LVDT) is set on the second floor. Experimental results indicate that the relative error between data from LVDT and analyzed data from digital image correlation is below 0.007%, 0.0205 in terms of frequency and displacement, respectively. Additionally, the appropriate image block affects the estimation accuracy of the measurement system. Importantly, the proposed approach for evaluating pattern center and size is highly promising for use in assigning the adaptive block for a digital image correlation method.en_US
dc.identifier.doi10.1155/2014/375210en_US
dc.identifier.issn1537-744Xen_US
dc.identifier.journalSCIENTIFIC WORLD JOURNALen_US
dc.identifier.urihttp://dx.doi.org/10.1155/2014/375210en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/24524
dc.identifier.wosnumberWOS:000336318200001
dc.language.isoen_USen_US
dc.titleIntegrating a Hive Triangle Pattern with Subpixel Analysis for Noncontact Measurement of Structural Dynamic Response by Using a Novel Image Processing Schemeen_US
dc.typeArticleen_US

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