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Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide

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Date

2008

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DOI

10.1109/SOI.2008.4656283

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http://dx.doi.org/10.1109/SOI.2008.4656283
 https://ir.lib.nycu.edu.tw/handle/11536/135057

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會議論文;;Conferences Paper

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