Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide
| dc.citation.epage | + | en_US |
| dc.citation.spage | 37 | en_US |
| dc.citation.woscount | 1 | en_US |
| dc.contributor.author | Kim, Keunwoo | en_US |
| dc.contributor.author | Kuang, Jente B. | en_US |
| dc.contributor.author | Gebara, Fadi | en_US |
| dc.contributor.author | Ngo, Hung C. | en_US |
| dc.contributor.author | Chuang, Ching-Te | en_US |
| dc.contributor.author | Nowka, Kevin J. | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.date.accessioned | 2017-04-21T06:49:36Z | |
| dc.date.available | 2017-04-21T06:49:36Z | |
| dc.date.issued | 2008 | en_US |
| dc.identifier.doi | 10.1109/SOI.2008.4656283 | en_US |
| dc.identifier.isbn | 978-1-4244-1954-8 | en_US |
| dc.identifier.issn | 1078-621X | en_US |
| dc.identifier.journal | 2008 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/SOI.2008.4656283 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/135057 | |
| dc.identifier.wosnumber | WOS:000262065700014 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide | en_US |
| dc.type | Proceedings Paper | en_US |
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