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Microwave surface impedance of a nearly ferroelectric superconductor

dc.citation.epage47en_US
dc.citation.spage39en_US
dc.citation.volume73en_US
dc.citation.woscount6
dc.contributor.authorWu, C.-J.en_US
dc.contributor.authorFu, C.-M.en_US
dc.contributor.authorKuo, W.-K.en_US
dc.contributor.authorYang, T.-J.en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:14:58Z
dc.date.available2014-12-08T15:14:58Z
dc.date.issued2007en_US
dc.description.abstractThe intrinsic microwave surface impedance for a nearly ferroelectric superconducting film of finite thickness in the dielectric-like response is theoretically investigated. It is based on the electrodynamics of a nearly ferroelectric superconductor that incorporates the Maxwell's equations, the lattice equations for an ionic lattice, and the superconducting London equation as well. It is found that the surface resistance will be enhanced with decreasing the film thickness when the thickness is less than the London penetration depth. However it will begin to resonate as a function of film thickness at the thickness being more than one London penetration depth. The anomalous resonance peaks occur when the thickness equals the even multiple of the London penetration depth. In the frequency-dependent surface resistance, the number of the resonance peaks is strongly dependent on the film thickness, increasing with increasing the thickness. In addition, peaks are not regularly spaced at a fixed interval. Discussion on this anomaly in the surface resistance will be given.en_US
dc.identifier.doi10.2528/PIER07030502en_US
dc.identifier.issn1559-8985en_US
dc.identifier.journalPROGRESS IN ELECTROMAGNETICS RESEARCH-PIERen_US
dc.identifier.urihttp://dx.doi.org/10.2528/PIER07030502en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/11259
dc.identifier.wosnumberWOS:000246722900004
dc.language.isoen_USen_US
dc.titleMicrowave surface impedance of a nearly ferroelectric superconductoren_US
dc.typeArticleen_US

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