Numerical study of super-resolved optical microscopy with partly staggered beams

dc.citation.issue	12	en_US
dc.citation.volume	18	en_US
dc.contributor.author	He, Jinping	en_US
dc.contributor.author	Wang, Nan	en_US
dc.contributor.author	Kobayashi, Takayoshi	en_US
dc.contributor.department	電機學院	zh_TW
dc.contributor.department	College of Electrical and Computer Engineering	en_US
dc.date.accessioned	2017-04-21T06:56:17Z
dc.date.available	2017-04-21T06:56:17Z
dc.date.issued	2016-12	en_US
dc.description.abstract	The resolving power of optical microscopy involving two or even more beams, such as pump-probe microscopy and nonlinear optical microscopy, can be enhanced both laterally and longitudinally with partly staggered beams. A numerical study of the new super-resolution imaging technology is performed with vector diffraction theory. The influence of polarization is discussed. A resolving power of sub-100 nm and sub-300 nm in the lateral and longitudinal directions, respectively, is achievable.	en_US
dc.identifier.doi	10.1088/2040-8978/18/12/125303	en_US
dc.identifier.issn	2040-8978	en_US
dc.identifier.journal	Journal of Optics	en_US
dc.identifier.uri	http://dx.doi.org/10.1088/2040-8978/18/12/125303	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/132777
dc.identifier.wosnumber	WOS:000389335000001	en_US
dc.language.iso	en_US	en_US
dc.subject	microscopy	en_US
dc.subject	super-resolution	en_US
dc.subject	partly staggered beams	en_US
dc.subject	vector diffraction theory	en_US
dc.title	Numerical study of super-resolved optical microscopy with partly staggered beams	en_US

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