RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method
| dc.citation.epage | + | en_US |
| dc.citation.spage | 2110 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Chen, Kun-Ming | en_US |
| dc.contributor.author | Chen, Han-Yu | en_US |
| dc.contributor.author | Huang, Guo-Wei | en_US |
| dc.contributor.author | Liao, Wen-Shiang | en_US |
| dc.contributor.author | Chang, Chun-Yen | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2017-04-21T06:48:55Z | |
| dc.date.available | 2017-04-21T06:48:55Z | |
| dc.date.issued | 2008 | en_US |
| dc.identifier.isbn | 978-1-4244-2641-6 | en_US |
| dc.identifier.journal | APMC: 2008 ASIA PACIFIC MICROWAVE CONFERENCE (APMC 2008), VOLS 1-5 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/135077 | |
| dc.identifier.wosnumber | WOS:000274900901025 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method | en_US |
| dc.type | Proceedings Paper | en_US |
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