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學術出版;;Publications
會議論文;;Conferences Paper
RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method
RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method
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Date
2008
Authors
Chen, Kun-Ming
Chen, Han-Yu
Huang, Guo-Wei
Liao, Wen-Shiang
Chang, Chun-Yen
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https://ir.lib.nycu.edu.tw/handle/11536/135077
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會議論文;;Conferences Paper
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