RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method

Title:	RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method
Authors:	Chen, Kun-Ming Chen, Han-Yu Huang, Guo-Wei Liao, Wen-Shiang Chang, Chun-Yen 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Issue Date:	2008
URI:	http://hdl.handle.net/11536/135077
ISBN:	978-1-4244-2641-6
Journal:	APMC: 2008 ASIA PACIFIC MICROWAVE CONFERENCE (APMC 2008), VOLS 1-5
Begin Page:	2110
End Page:	+
Appears in Collections:	Conferences Paper