標題: RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method
作者: Chen, Kun-Ming
Chen, Han-Yu
Huang, Guo-Wei
Liao, Wen-Shiang
Chang, Chun-Yen
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2008
URI: http://hdl.handle.net/11536/135077
ISBN: 978-1-4244-2641-6
期刊: APMC: 2008 ASIA PACIFIC MICROWAVE CONFERENCE (APMC 2008), VOLS 1-5
起始頁: 2110
結束頁: +
顯示於類別:會議論文