A SYSTEMATIC-APPROACH TO ANALYTIC DETERMINATION OF CAMERA PARAMETERS BY LINE FEATURES
| dc.citation.epage | 877 | en_US |
| dc.citation.issue | 8 | en_US |
| dc.citation.spage | 859 | en_US |
| dc.citation.volume | 23 | en_US |
| dc.citation.woscount | 17 | |
| dc.contributor.author | CHEN, SY | en_US |
| dc.contributor.author | TSAI, WH | en_US |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.date.accessioned | 2014-12-08T15:05:41Z | |
| dc.date.available | 2014-12-08T15:05:41Z | |
| dc.date.issued | 1990 | en_US |
| dc.identifier.issn | 0031-3203 | en_US |
| dc.identifier.journal | PATTERN RECOGNITION | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4222 | |
| dc.identifier.wosnumber | WOS:A1990DX39200005 | |
| dc.language.iso | en_US | en_US |
| dc.title | A SYSTEMATIC-APPROACH TO ANALYTIC DETERMINATION OF CAMERA PARAMETERS BY LINE FEATURES | en_US |
| dc.type | Article | en_US |
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