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High efficiency light emitting diode with anisotropically etched GaN-sapphire interface

dc.citation.epageen_US
dc.citation.issue4en_US
dc.citation.volume95en_US
dc.citation.woscount28
dc.contributor.authorLo, M. H.en_US
dc.contributor.authorTu, P. M.en_US
dc.contributor.authorWang, C. H.en_US
dc.contributor.authorHung, C. W.en_US
dc.contributor.authorHsu, S. C.en_US
dc.contributor.authorCheng, Y. J.en_US
dc.contributor.authorKuo, H. C.en_US
dc.contributor.authorZan, H. W.en_US
dc.contributor.authorWang, S. C.en_US
dc.contributor.authorChang, C. Y.en_US
dc.contributor.authorHuang, S. C.en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:09:06Z
dc.date.available2014-12-08T15:09:06Z
dc.date.issued2009-07-27en_US
dc.description.abstractWe report the fabrication and study of high efficiency ultraviolet light emitting diodes with inverted micropyramid structures at GaN-sapphire interface. The micropyramid structures were created by anisotropic chemical wet etching. The pyramid structures have significantly enhanced the light output efficiency and at the same time also improved the crystal quality by partially relieving the strain and reducing the dislocation defects in GaN. The electroluminescent output power at normal direction was enhanced by 120% at 20 mA injection current and the output power integrated over all directions was enhanced by 85% compared to a reference sample.en_US
dc.identifier.doi10.1063/1.3190504en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3190504en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/6939
dc.identifier.wosnumberWOS:000268611900009
dc.language.isoen_USen_US
dc.subjectdislocationsen_US
dc.subjectelectroluminescent devicesen_US
dc.subjectetchingen_US
dc.subjectgallium compoundsen_US
dc.subjectIII-V semiconductorsen_US
dc.subjectlight emitting diodesen_US
dc.subjectsapphireen_US
dc.subjectwide band gap semiconductorsen_US
dc.titleHigh efficiency light emitting diode with anisotropically etched GaN-sapphire interfaceen_US
dc.typeArticleen_US

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