Highly reliable integrated amorphous silicon thin film transistors gate driver

Abstract

A reliable shift register consisted of amorphous silicon thin film transistors (a-Si TFTs) is proposed for scan driver circuit of active matrix liquid crystal display (AMLCD). The lifetime of proposed circuit is evaluated based on the reliability measurement data of the a-Si TFTs used and it is estimated to over 5000 hours. Therefore, a highly reliable scanning circuit can be achieved.