Highly reliable integrated amorphous silicon thin film transistors gate driver
| dc.citation.epage | 522 | en_US |
| dc.citation.spage | 519 | en_US |
| dc.contributor.author | Liu, Chin-Wei | en_US |
| dc.contributor.author | Tai, Ya-Hsiang | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:12:04Z | |
| dc.date.available | 2014-12-08T15:12:04Z | |
| dc.date.issued | 2007 | en_US |
| dc.description.abstract | A reliable shift register consisted of amorphous silicon thin film transistors (a-Si TFTs) is proposed for scan driver circuit of active matrix liquid crystal display (AMLCD). The lifetime of proposed circuit is evaluated based on the reliability measurement data of the a-Si TFTs used and it is estimated to over 5000 hours. Therefore, a highly reliable scanning circuit can be achieved. | en_US |
| dc.identifier.isbn | 978-957-28522-4-8 | en_US |
| dc.identifier.journal | IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/9257 | |
| dc.identifier.wosnumber | WOS:000258177700134 | |
| dc.language.iso | en_US | en_US |
| dc.title | Highly reliable integrated amorphous silicon thin film transistors gate driver | en_US |
| dc.type | Proceedings Paper | en_US |
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