<link rel="stylesheet" href="styles.cf390c6bfbe7555f.css"> Skip to main content

SOME PROCESS CAPABILITY INDEXES ARE MORE RELIABLE THAN ONE MIGHT THINK

dc.citation.epage62en_US
dc.citation.issue1en_US
dc.citation.spage55en_US
dc.citation.volume42en_US
dc.citation.woscount41
dc.contributor.authorKOTZ, Sen_US
dc.contributor.authorPEARN, WLen_US
dc.contributor.authorJOHNSON, NLen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.date.accessioned2014-12-08T15:04:40Z
dc.date.available2014-12-08T15:04:40Z
dc.date.issued1993en_US
dc.description.abstractIn this paper we obtain formulae for exact expected values and standard deviations of estimators of certain process capability indices discussed by Bissell. In particular, we show that for the index C(pk) Bissell's formula gives values for the standard deviation which are too high especially when the actual population mean value is close to (or equal to) the average of the upper and lower specification limits.en_US
dc.identifier.doi10.2307/2347409en_US
dc.identifier.issn0035-9254en_US
dc.identifier.journalAPPLIED STATISTICS-JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES Cen_US
dc.identifier.urihttp://dx.doi.org/10.2307/2347409en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/3157
dc.identifier.wosnumberWOS:A1993KJ08500005
dc.language.isoen_USen_US
dc.subjectCAPABILITY INDEXESen_US
dc.subjectNONCENTRAL CHI-2-DISTRIBUTIONen_US
dc.subjectSTANDARD ERRORen_US
dc.subjectSTIRLING APPROXIMATIONen_US
dc.titleSOME PROCESS CAPABILITY INDEXES ARE MORE RELIABLE THAN ONE MIGHT THINKen_US
dc.typeArticleen_US

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
A1993KJ08500005.pdf
Size:
502.44 KB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed to upon submission
Description: