Comprehensive Trap-Level Study in SiOx-based Resistive Switching Memory
| dc.citation.epage | + | en_US |
| dc.citation.spage | 135 | en_US |
| dc.citation.woscount | 1 | en_US |
| dc.contributor.author | Chang, Yao-Feng | en_US |
| dc.contributor.author | Chen, Ying-Chen | en_US |
| dc.contributor.author | Li, Ji | en_US |
| dc.contributor.author | Xue, Fei | en_US |
| dc.contributor.author | Wang, Yanzhen | en_US |
| dc.contributor.author | Zhou, Fei | en_US |
| dc.contributor.author | Fowler, Burt | en_US |
| dc.contributor.author | Lee, Jack C. | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2017-04-21T06:48:34Z | |
| dc.date.available | 2017-04-21T06:48:34Z | |
| dc.date.issued | 2013 | en_US |
| dc.identifier.isbn | 978-1-4799-0811-0 | en_US |
| dc.identifier.isbn | 978-1-4799-0812-7 | en_US |
| dc.identifier.issn | 1548-3770 | en_US |
| dc.identifier.journal | 2013 71ST ANNUAL DEVICE RESEARCH CONFERENCE (DRC) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/134738 | |
| dc.identifier.wosnumber | WOS:000347466000073 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Comprehensive Trap-Level Study in SiOx-based Resistive Switching Memory | en_US |
| dc.type | Proceedings Paper | en_US |
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