Skip to main content
Log In
Communities & Collections
All of DSpace
Statistics
Home
學術出版;;Publications
會議論文;;Conferences Paper
Comprehensive Trap-Level Study in SiOx-based Resistive Switching Memory
Comprehensive Trap-Level Study in SiOx-based Resistive Switching Memory
Loading...
Date
2013
Authors
Chang, Yao-Feng
Chen, Ying-Chen
Li, Ji
Xue, Fei
Wang, Yanzhen
Zhou, Fei
Fowler, Burt
Lee, Jack C.
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
Abstract
Description
Keywords
Citation
URI
https://ir.lib.nycu.edu.tw/handle/11536/134738
Collections
會議論文;;Conferences Paper
Endorsement
Review
Supplemented By
Referenced By
Full item page
