Method for determining the fast axis and phase retardation of a wave plate
| dc.citation.epage | 1929 | en_US |
| dc.citation.issue | 9 | en_US |
| dc.citation.spage | 1924 | en_US |
| dc.citation.volume | 13 | en_US |
| dc.contributor.author | Chiu, MH | en_US |
| dc.contributor.author | Chen, CD | en_US |
| dc.contributor.author | Su, DC | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:02:24Z | |
| dc.date.available | 2014-12-08T15:02:24Z | |
| dc.date.issued | 1996-09-01 | en_US |
| dc.description.abstract | Based on the heterodyne interferometric technique and the discrimination technique of using two light beams with different wavelengths, a novel method for identifying the fast axis of a wave plate and evaluating its phase retardation is presented. Some of the merits of the method, such as, a simple optical setup, high stability, better resolution, and easier operation, are presented, and the validity of the method is demonstrated. (C) 1996 Optical Society of America. | en_US |
| dc.identifier.issn | 0740-3232 | en_US |
| dc.identifier.journal | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/1075 | |
| dc.language.iso | en_US | en_US |
| dc.title | Method for determining the fast axis and phase retardation of a wave plate | en_US |
| dc.type | Article | en_US |