FAULT-DETECTION IN SEQUENTIAL-MACHINES WITH INCREASED FAULT COVERAGE
| dc.citation.epage | 29 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 28 | en_US |
| dc.citation.volume | 14 | en_US |
| dc.citation.woscount | 5 | |
| dc.contributor.author | DAS, SR | en_US |
| dc.contributor.author | BHATTACHARYYA, A | en_US |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.date.accessioned | 2014-12-08T15:07:10Z | |
| dc.date.available | 2014-12-08T15:07:10Z | |
| dc.date.issued | 1978 | en_US |
| dc.identifier.issn | 0013-5194 | en_US |
| dc.identifier.journal | ELECTRONICS LETTERS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/5631 | |
| dc.identifier.wosnumber | WOS:A1978EM96900003 | |
| dc.language.iso | en_US | en_US |
| dc.title | FAULT-DETECTION IN SEQUENTIAL-MACHINES WITH INCREASED FAULT COVERAGE | en_US |
| dc.type | Article | en_US |