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Temperature-dependent carrier-phonon coupling in topological insulator Bi2Se3

dc.citation.issue23en_US
dc.citation.volume105en_US
dc.citation.woscount0en_US
dc.contributor.authorLai, Yi-Pingen_US
dc.contributor.authorChen, Hsueh-Juen_US
dc.contributor.authorWu, Kuang-Hsiungen_US
dc.contributor.authorLiu, Jia-Mingen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2015-07-21T11:21:01Z
dc.date.available2015-07-21T11:21:01Z
dc.date.issued2014-12-08en_US
dc.description.abstractTemperature-dependent (11.0K +/- 294.5 K) carrier-phonon coupling in Bi2Se3 is investigated by ultrafast pump-probe spectroscopy. The rise time of the differential reflectivity is interpreted by a combined effect of electron temperature relaxation and hot-phonon lifetime. The electron-phonon coupling constant of the bulk state (lambda = 0.63 +/- 0.05) is deduced from theoretical fitting. Increasing hot-phonon lifetime with decreasing temperature is attributed to a decreasing phonon-phonon collision rate. A complete analysis of the thermalization process is presented. Understanding carrier and phonon dynamics is essential for future optoelectronic and spintronic applications of topological insulators. (C) 2014 AIP Publishing LLC.en_US
dc.identifier.doi10.1063/1.4904009en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4904009en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/124076
dc.identifier.wosnumberWOS:000346266000052en_US
dc.language.isoen_USen_US
dc.titleTemperature-dependent carrier-phonon coupling in topological insulator Bi2Se3en_US
dc.typeArticleen_US

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