Improving the Accuracy of Automated GUI Testing for Embedded Systems
| dc.citation.epage | 45 | en_US |
| dc.citation.issue | 1 | en_US |
| dc.citation.spage | 39 | en_US |
| dc.citation.volume | 31 | en_US |
| dc.citation.woscount | 1 | |
| dc.contributor.author | Lin, Ying-Dar | en_US |
| dc.contributor.author | Chu, Edward T. -H. | en_US |
| dc.contributor.author | Yu, Shang-Che | en_US |
| dc.contributor.author | Lai, Yuan-Cheng | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.date.accessioned | 2014-12-08T15:35:38Z | |
| dc.date.available | 2014-12-08T15:35:38Z | |
| dc.date.issued | 2014-01-01 | en_US |
| dc.identifier.doi | 10.1109/MS.2013.100 | en_US |
| dc.identifier.issn | 0740-7459 | en_US |
| dc.identifier.journal | IEEE SOFTWARE | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/MS.2013.100 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/24056 | |
| dc.identifier.wosnumber | WOS:000332601500009 | |
| dc.language.iso | en_US | en_US |
| dc.title | Improving the Accuracy of Automated GUI Testing for Embedded Systems | en_US |
| dc.type | Article | en_US |