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Two-dimensional linear Birefringence vector measurement by polarization-stepping interferometer

dc.citation.epage1637en_US
dc.citation.issue4Aen_US
dc.citation.spage1633en_US
dc.citation.volume43en_US
dc.citation.woscount3
dc.contributor.authorLang, KCen_US
dc.contributor.authorTeng, HKen_US
dc.contributor.authorChang, HFen_US
dc.contributor.authorHan, CYen_US
dc.contributor.authorChou, Cen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:39:25Z
dc.date.available2014-12-08T15:39:25Z
dc.date.issued2004-04-01en_US
dc.description.abstractA simple polarization-stepping technique in combination with a common-path homodyne interferometer is proposed in order to measure the phase retardation and the fast-axis angle, which are defined as the linear birefringence vector (LBV), of a wave plate (WP). At three different orientation angles of the linear polarization of incident laser beam, two-dimensional (2-D) interference patterns with respect to different orientation angle are recorded by using a CCD camera. Thus, 2-D phase retardation and fast-axis angle distributions of WP are determined simultaneously. In addition, the elliptical polarization and misalignment of the orientation angle of the incident laser beam induced errors on LBV measurement are discusseden_US
dc.identifier.doi10.1143/JJAP.43.1633en_US
dc.identifier.issn0021-4922en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERSen_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.43.1633en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/26919
dc.identifier.wosnumberWOS:000221200400077
dc.language.isoen_USen_US
dc.subjectpolarization-steppingen_US
dc.subjectlinear birefringenceen_US
dc.subjectwave plateen_US
dc.subjectpolarimeteren_US
dc.titleTwo-dimensional linear Birefringence vector measurement by polarization-stepping interferometeren_US
dc.typeArticleen_US

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