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A non-selenization technology by co-sputtering deposition for solar cell applications

dc.citation.epage2760en_US
dc.citation.issue13en_US
dc.citation.volume37en_US
dc.citation.woscount7
dc.contributor.authorJheng, Bao-Tangen_US
dc.contributor.authorLiu, Po-Tsunen_US
dc.contributor.authorWu, Meng-Chyien_US
dc.contributor.authorShieh, Han-Ping D.en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of Displayen_US
dc.date.accessioned2014-12-08T15:23:56Z
dc.date.available2014-12-08T15:23:56Z
dc.date.issued1970-01-01en_US
dc.description.abstract"This work presents a novel method to form polycrystalline Cu(In1-xGax)Se-2 (CIGS) thin film by co-sputtering of In-Se and Cu-Ga alloy targets without an additional selenization process. An attempt was also made to thoroughly elucidate the surface morphology, crystalline phases, physical properties, and chemical properties of the CIGS films by using material analysis methods. Experimental results indicate that CIGS thin films featured densely packed grains and chalcopyrite phase peaks of (112), (220), (204), (312), and (116). Raman spectroscopy analysis revealed chalcopyrite CIGS phase with Raman shift at 175 cm(-1), while no signal at 258 cm(-1) indicated the exclusion of Cu2-xSe phase. Hall effect measurements confirmed the polycrystalline Cu(In, Ga)Se-2 thin film to be of p type semiconductor with a film resistivity and mobility of 2.19 x 102 Omega cm and 88 cm(2)/V s, respectively. (C) 2012 Optical Society of America"en_US
dc.identifier.issn0146-9592en_US
dc.identifier.journalOPTICS LETTERSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/16658
dc.identifier.wosnumberWOS:000306105800110
dc.language.isoen_USen_US
dc.titleA non-selenization technology by co-sputtering deposition for solar cell applicationsen_US
dc.typeArticleen_US

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