In the blink of a silicon eye
| dc.citation.epage | 32 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 20 | en_US |
| dc.citation.volume | 17 | en_US |
| dc.citation.woscount | 8 | |
| dc.contributor.author | Cheng, CH | en_US |
| dc.contributor.author | Wu, CY | en_US |
| dc.contributor.author | Sheu, B | en_US |
| dc.contributor.author | Lin, LJ | en_US |
| dc.contributor.author | Huang, KH | en_US |
| dc.contributor.author | Jiang, HC | en_US |
| dc.contributor.author | Yen, WC | en_US |
| dc.contributor.author | Hsiao, CW | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:43:54Z | |
| dc.date.available | 2014-12-08T15:43:54Z | |
| dc.date.issued | 2001-05-01 | en_US |
| dc.identifier.doi | 10.1109/101.933788 | en_US |
| dc.identifier.issn | 8755-3996 | en_US |
| dc.identifier.journal | IEEE CIRCUITS & DEVICES | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/101.933788 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/29682 | |
| dc.identifier.wosnumber | WOS:000169452800005 | |
| dc.language.iso | en_US | en_US |
| dc.title | In the blink of a silicon eye | en_US |
| dc.type | Article | en_US |