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Raman spectroscopy study of Zn1-xFexSe under high pressure

dc.citation.epage955en_US
dc.citation.issue10en_US
dc.citation.spage951en_US
dc.citation.volume30en_US
dc.citation.woscount1
dc.contributor.authorLin, CMen_US
dc.contributor.authorChuu, DSen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:46:12Z
dc.date.available2014-12-08T15:46:12Z
dc.date.issued1999-10-01en_US
dc.description.abstractZn1-xFexSe, x = 0, 0.018, 0.035 and 0.16, were studied by Raman scattering spectroscopy up to 35.0 GPa, Lt was found that the semiconductor-metal phase transition pressures for these samples are 14.4, 12.8, 12.0 and 10.9 Cpa, respectively. Before the semiconductor-metal phase transition, a visible anomaly of the TO Raman mode splitting was observed at 4.7 and 9.1 GPa for ZnSe, at 3.3 and 5.9 GPa for Zn0.982Fe0.018Se, and at 4.5 and 7.2 Cpa for Zn0.965Fe0.035Se, respectively, while Zn0.84Fe0.16Se showed mode splitting at 4.7 GPa only. For these samples, one of the TO splitting modes exhibits phonon softening (red shift), while the other manifests wavenumber increasing (blue shift) with pressure. For x = 0.018, 0.035 and 0.16, a new Raman mode, which was identified as Fe local mode, was observed between the pure ZnSe LO and TO modes, Fe local mode exhibits blue shift behaviour before metallization and disappears as the pressure is higher beyond the metallization pressure. PACS numbers: 62.50. + p, 64.60. - i, 78.30.Fs. Copyright (C) 1999 John Wiley & Sons, Ltd.en_US
dc.identifier.issn0377-0486en_US
dc.identifier.journalJOURNAL OF RAMAN SPECTROSCOPYen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/31073
dc.identifier.wosnumberWOS:000083469400013
dc.language.isoen_USen_US
dc.titleRaman spectroscopy study of Zn1-xFexSe under high pressureen_US
dc.typeArticleen_US

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