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Radio Frequency Power Performance Enhancement for Asymmetric Lightly Doped Drain Metal-Oxide-Semiconductor Field-Effect Transistors on SiC Substrate

dc.citation.issue1en_US
dc.citation.volume49en_US
dc.citation.woscount1
dc.contributor.authorChang, Tsuen_US
dc.contributor.authorKao, Hsuan-lingen_US
dc.contributor.authorLiu, S. L.en_US
dc.contributor.authorDeng, Joseph D. S.en_US
dc.contributor.authorHorng, K. Y.en_US
dc.contributor.authorChin, Alberten_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:07:59Z
dc.date.available2014-12-08T15:07:59Z
dc.date.issued2010en_US
dc.description.abstractIn this paper we report the DC characteristics and radio frequency (RF) power performance improvement as high as 6.6% of asymmetric lightly doped drain metal-oxide-semiconductor field-effect transistors (asymmetric LDD MOSFET, AMOSFET) with 50-mu m-thick silicon substrates on SiC substrates. The self-heating and parasitic effects of large size AMOSFETs with 50-mu m-thick silicon on SiC substrates are reduced owing to good heat dissipation and less lossy behaviors of thinned silicon substrates and SiC substrates. Therefore, the power gain, saturation output power, and power added efficiency of AMOSFETs with 50-mu m-thick Si substrates mounted on SiC substrates is improved. (C) 2010 The Japan Society of Applied Physicsen_US
dc.identifier.doi10.1143/JJAP.49.014104en_US
dc.identifier.issn0021-4922en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.49.014104en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/6274
dc.identifier.wosnumberWOS:000275607900034
dc.language.isoen_USen_US
dc.titleRadio Frequency Power Performance Enhancement for Asymmetric Lightly Doped Drain Metal-Oxide-Semiconductor Field-Effect Transistors on SiC Substrateen_US
dc.typeArticleen_US

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