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PERIODIC FLUX INTERRUPTION AND SUSTAINED TWO-DIMENSIONAL GROWTH FOR MOLECULAR-BEAM EPITAXY

dc.citation.epage1660en_US
dc.citation.issue24en_US
dc.citation.spage1659en_US
dc.citation.volume25en_US
dc.citation.woscount1
dc.contributor.authorLEE, CPen_US
dc.contributor.authorCHANG, KHen_US
dc.contributor.authorLIU, DGen_US
dc.contributor.authorWU, JSen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:05:43Z
dc.date.available2014-12-08T15:05:43Z
dc.date.issued1989-11-23en_US
dc.identifier.issn0013-5194en_US
dc.identifier.journalELECTRONICS LETTERSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4260
dc.identifier.wosnumberWOS:A1989CD53700030
dc.language.isoen_USen_US
dc.titlePERIODIC FLUX INTERRUPTION AND SUSTAINED TWO-DIMENSIONAL GROWTH FOR MOLECULAR-BEAM EPITAXYen_US
dc.typeArticleen_US

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