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Effect of Sensing Film Thickness on Sensing Characteristics of Dual-Gate Poly-Si Ion-Sensitive Field-Effect-Transistors

dc.citation.epage1304en_US
dc.citation.issue12en_US
dc.citation.spage1302en_US
dc.citation.volume35en_US
dc.citation.woscount0en_US
dc.contributor.authorYen, Li-Chenen_US
dc.contributor.authorTang, Ming-Tsyren_US
dc.contributor.authorTan, Chia-Yingen_US
dc.contributor.authorPan, Tung-Mingen_US
dc.contributor.authorChao, Tien-Shengen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2015-07-21T11:20:55Z
dc.date.available2015-07-21T11:20:55Z
dc.date.issued2014-12-01en_US
dc.description.abstractWe investigate the effect of sensing film thickness on the sensing characteristics of dual-gate (DG) poly-Si ion-sensitive field-effect transistors (ISFETs). The pH sensitivity (from 37.57 to 9.32 mV/pH) of the DG poly-Si ISFET device degrades with the increase in the sensing film thickness (from 20 to 120 nm), whereas hysteresis voltage (from 6.7 to 1.12 mV for a neutral to acid to alkaline to neural loop) and drift rate (from 13.47 to <3 mV/h at pH 7) improve accordingly. An improved hysteresis and drift phenomena are attributed to the reduction in top-gate capacitance of the sensing membrane, causing a smaller capacitive-coupling ratio (top-gate capacitance of sensing membrane to bottom-gate capacitance of tetraethylorthosilicate oxide).en_US
dc.identifier.doi10.1109/LED.2014.2365478en_US
dc.identifier.issn0741-3106en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2014.2365478en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/123866
dc.identifier.wosnumberWOS:000345575400047en_US
dc.language.isoen_USen_US
dc.subjectDriften_US
dc.subjectdual-gate (DG)en_US
dc.subjecthysteresisen_US
dc.subjection-sensitive field-effect transistor (ISFET)en_US
dc.subjectpoly-Sien_US
dc.subjectsensitivityen_US
dc.titleEffect of Sensing Film Thickness on Sensing Characteristics of Dual-Gate Poly-Si Ion-Sensitive Field-Effect-Transistorsen_US
dc.typeArticleen_US

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