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Graphene On Au-Coated SiOx Substrate: Its Core-Level Photoelectron Microspectroscopy Study

dc.citation.epageen_US
dc.citation.issue8en_US
dc.citation.volume5en_US
dc.citation.woscount4
dc.contributor.authorChen, Jhih-Weien_US
dc.contributor.authorWang, Chiang-Lunen_US
dc.contributor.authorShiu, Hung Weien_US
dc.contributor.authorLin, Chi-Yuanen_US
dc.contributor.authorChang, Chen-Shiungen_US
dc.contributor.authorChien, Forest Shih-Senen_US
dc.contributor.authorChen, Chia-Haoen_US
dc.contributor.authorChen, Yi-Chunen_US
dc.contributor.authorWu, Chung-Linen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:23:47Z
dc.date.available2014-12-08T15:23:47Z
dc.date.issued2012-08-01en_US
dc.description.abstract"The core-level electronic structures of exfoliated graphene sheets on a Au-coated SiOx substrate have been studied using synchrotron radiation photoelectron spectroscopy (SR-PES) on a micron scale. The graphene's visibility on the Au-coated SiOx substrate was first demonstrated by micro optical characterization, and then an SR-PES study was conducted. Because of the elimination of charging effect, a precise C 1s core-level characterization shows graphitic and contaminated carbon states of graphene. Different levels of Au-coating-induced p-type doping on single-and double-layer graphene sheets were also examined in the C 1s core-level shift. The Au-coated SiOx substrate can be treated as a simple but high-throughput platform for in situ studying graphene under further hybridization by PES. (C) 2012 The Japan Society of Applied Physics"en_US
dc.identifier.doi85101en_US
dc.identifier.issn1882-0778en_US
dc.identifier.journalAPPLIED PHYSICS EXPRESSen_US
dc.identifier.urihttp://dx.doi.org/85101en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/16597
dc.identifier.wosnumberWOS:000307381500030
dc.language.isoen_USen_US
dc.titleGraphene On Au-Coated SiOx Substrate: Its Core-Level Photoelectron Microspectroscopy Studyen_US
dc.typeArticleen_US

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