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A Bayesian-like estimator of C-pk

dc.citation.epage329en_US
dc.citation.issue2en_US
dc.citation.spage321en_US
dc.citation.volume25en_US
dc.citation.woscount16
dc.contributor.authorPearn, WLen_US
dc.contributor.authorChen, KSen_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:02:59Z
dc.date.available2014-12-08T15:02:59Z
dc.date.issued1996en_US
dc.description.abstractBissell (1990) proposed an estimator for the process capability index C-pk assuming the knowledge whether the process mean mu < m or mu greater than or equal to m is available, where m is the mid-point between the upper and lower specification limits. Kotz, Pearn and Johnson (1993) showed that for the index C-pk, the natural estimator gives values for the standard deviation smaller than those of Bissell's. In this paper we show that by adding a well-known correction factor to Bissell's estimator, we obtain an unbiased estimator of C-pk whose standard deviation is smaller than those given in Kotz, Pearn and Johnson (1993). In addition, we propose a Bayesian-like estimator which relaxes Bissell's assumption on the process mean. The distribution of the new estimator is shown to be identical to that of Bissell's estimator.en_US
dc.identifier.issn0361-0918en_US
dc.identifier.journalCOMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATIONen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/1579
dc.identifier.wosnumberWOS:A1996UH88900003
dc.language.isoen_USen_US
dc.subjectprocess capability indexen_US
dc.subjectspecification limiten_US
dc.subjectprocess meanen_US
dc.subjectprocess standard deviationen_US
dc.titleA Bayesian-like estimator of C-pken_US
dc.typeArticleen_US

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