Critical length of nanowires for hydrophobic behavior
| dc.citation.epage | 20 | en_US |
| dc.citation.issue | 1-3 | en_US |
| dc.citation.spage | 17 | en_US |
| dc.citation.volume | 397 | en_US |
| dc.citation.woscount | 25 | |
| dc.contributor.author | Cheng, YH | en_US |
| dc.contributor.author | Chou, CK | en_US |
| dc.contributor.author | Chih, C | en_US |
| dc.contributor.author | Cheng, SY | en_US |
| dc.contributor.department | 材料科學與工程學系 | zh_TW |
| dc.contributor.department | Department of Materials Science and Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:37:27Z | |
| dc.date.available | 2014-12-08T15:37:27Z | |
| dc.date.issued | 2004-10-11 | en_US |
| dc.description.abstract | This Letter investigates the wetting behavior on surface with well-controlled nanoscale structure. Water and water-alcohol droplets were brought to contact the surface electroplated by Ag nanowires. It is found that hydrophobic behavior becomes more pronounced as the length of the nanowires increases. A critical length of approximately 100 nm is observed, beyond which the contact angle approaches a steady value of 130degrees. In addition, the contact angle of water levels off around 160degrees when the length of the fluorine-coated Ag nanowires exceeds the critical value of 100 nm. The mechanism of the hydrophobic behavior on surface with nanoscale structure is proposed. (C) 2004 Elsevier B.V. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/j.cplett.2004.08.063 | en_US |
| dc.identifier.issn | 0009-2614 | en_US |
| dc.identifier.journal | CHEMICAL PHYSICS LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/j.cplett.2004.08.063 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/25766 | |
| dc.identifier.wosnumber | WOS:000224368100004 | |
| dc.language.iso | en_US | en_US |
| dc.title | Critical length of nanowires for hydrophobic behavior | en_US |
| dc.type | Article | en_US |