Parameter extraction of resistive thermal microsensors by AC electrical method
| dc.citation.epage | 408 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 403 | en_US |
| dc.citation.volume | 47 | en_US |
| dc.citation.woscount | 5 | |
| dc.contributor.author | Ou-Yang, M | en_US |
| dc.contributor.author | Sheen, CS | en_US |
| dc.contributor.author | Shie, JS | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:49:13Z | |
| dc.date.available | 2014-12-08T15:49:13Z | |
| dc.date.issued | 1998-04-01 | en_US |
| dc.description.abstract | Obtaining device parameters of thermal microsensors is essential for evaluating their performances and simulation modeling. We report an sc electrical method for extracting these parameters experimentally with relatively simple instrumentation. The basic parameters of resistive microsensors, the resistance, temperature coefficient of resistance, thermal capacitance, and conductance, are derivable from the second harmonic signal of the output voltage induced by a sinusoidal driving current. The results are compared with other methods. | en_US |
| dc.identifier.issn | 0018-9456 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/32709 | |
| dc.identifier.wosnumber | WOS:000078557800011 | |
| dc.language.iso | en_US | en_US |
| dc.subject | AC electrical method thermal variables measurement | en_US |
| dc.subject | electrothermal effect | en_US |
| dc.subject | parameter extraction | en_US |
| dc.subject | thermal microsensors | en_US |
| dc.title | Parameter extraction of resistive thermal microsensors by AC electrical method | en_US |
| dc.type | Article | en_US |