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Development of a multiplex fast-scan system for ultrafast time-resolved spectroscopy

dc.citation.epageen_US
dc.citation.issue6en_US
dc.citation.volume81en_US
dc.citation.woscount4
dc.contributor.authorYabushita, Atsushien_US
dc.contributor.authorLee, Yu-Hsienen_US
dc.contributor.authorKobayashi, Takayoshien_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:06:44Z
dc.date.available2014-12-08T15:06:44Z
dc.date.issued2010-06-01en_US
dc.description.abstractA fast-scan method was developed to obtain time-resolved signals with femtosecond resolution over a picosecond range on the fly and in real time. Traditional fast-scan methods collect data at each probe wavelength one by one, which is time consuming and thus not possible for the study of photofragile materials. In this work, we have developed a system that performs fast scans with multiplex detection. Ultrafast time-resolved spectroscopy was demonstrated using the newly developed system. Femtosecond laser pulses have been used for pump-probe studies of ultrafast processes in various materials, and both electronic relaxation and vibrational dynamics have been studied. However, experiments have been limited in sensitivity and reliability because they are affected by the long-term instability of the ultrashort laser pulses and by the fragility of the samples. The instability of the sources hinders precise determination of electronic decay dynamics and introduces systematic errors. The fragility of the samples reduces their amount or concentration, and can lead to contamination of the materials even if they were pure before the measurement. These effects make it difficult to obtain reproducible and reliable experimental data. In the present work, we have developed a fast-scan pump-probe spectroscopic system that can complete a set of measurements in less than 2 min. Quantitative estimates of the signal reproducibility demonstrate that these measurements provide higher reproducibility and reliability than conventional measurements. (C) 2010 American Institute of Physics. [doi:10.1063/1.3455809]en_US
dc.identifier.doi10.1063/1.3455809en_US
dc.identifier.issn0034-6748en_US
dc.identifier.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3455809en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/5286
dc.identifier.wosnumberWOS:000280102200010
dc.language.isoen_USen_US
dc.titleDevelopment of a multiplex fast-scan system for ultrafast time-resolved spectroscopyen_US
dc.typeArticleen_US

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