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FORMATION OF 0.1-MU-M N+ P JUNCTION BY AS+ IMPLANTATION THROUGH PT OR PTSI FILM

dc.citation.epage3526en_US
dc.citation.issue7en_US
dc.citation.spage3524en_US
dc.citation.volume67en_US
dc.citation.woscount3
dc.contributor.authorTSUI, BYen_US
dc.contributor.authorCHEN, MCen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:05:36Z
dc.date.available2014-12-08T15:05:36Z
dc.date.issued1990-04-01en_US
dc.identifier.doi10.1063/1.345346en_US
dc.identifier.issn0021-8979en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.345346en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4142
dc.identifier.wosnumberWOS:A1990CV63900049
dc.language.isoen_USen_US
dc.titleFORMATION OF 0.1-MU-M N+ P JUNCTION BY AS+ IMPLANTATION THROUGH PT OR PTSI FILMen_US
dc.typeNoteen_US

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