Pulse-read on erasable thermal phase-change superresolution disks
| dc.citation.epage | 8194 | en_US |
| dc.citation.issue | 35 | en_US |
| dc.citation.spage | 8187 | en_US |
| dc.citation.volume | 37 | en_US |
| dc.citation.woscount | 6 | |
| dc.contributor.author | Liu, JR | en_US |
| dc.contributor.author | Liu, PY | en_US |
| dc.contributor.author | Tang, NY | en_US |
| dc.contributor.author | Shieh, HPD | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:47:14Z | |
| dc.date.available | 2014-12-08T15:47:14Z | |
| dc.date.issued | 1998-12-10 | en_US |
| dc.description.abstract | New erasable thermal phase-change superresolution (EPSR) disks composed of mask and recording layers can increase recording density by the detection of the below-diffraction-limited marks within the readout spot. The formation of the aperture and the readout signal on the EPSR disk were analyzed. The feasibility of optically designed EPSR disks was evaluated by thermal simulation. A carrier-to-noise ratio of 32 dB at a mark size of 0.4 mu m, 8 dB higher than that of a conventional disk, was obtained by application of a pulse-read method to the EPSR disks at a wavelength of 780 nm and a numerical aperture of 0.55. (C) 1998 Optical Society of America. | en_US |
| dc.identifier.issn | 0003-6935 | en_US |
| dc.identifier.journal | APPLIED OPTICS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/31684 | |
| dc.identifier.wosnumber | WOS:000077548100004 | |
| dc.language.iso | en_US | en_US |
| dc.title | Pulse-read on erasable thermal phase-change superresolution disks | en_US |
| dc.type | Article | en_US |