Dielectric breakdown patterns and active walker model
| dc.citation.epage | 1544 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 1540 | en_US |
| dc.citation.volume | 59 | en_US |
| dc.citation.woscount | 13 | en_US |
| dc.contributor.author | Sheu, CR | en_US |
| dc.contributor.author | Cheng, CY | en_US |
| dc.contributor.author | Pan, RP | en_US |
| dc.contributor.department | 電子物理學系 | zh_TW |
| dc.contributor.department | Department of Electrophysics | en_US |
| dc.date.accessioned | 2019-04-03T06:39:17Z | |
| dc.date.available | 2019-04-03T06:39:17Z | |
| dc.date.issued | 1999-02-01 | en_US |
| dc.description.abstract | Simulations based on the active walker model an used successfully to reconstruct the dielectric breakdown patterns observed in a cell with parallel-plate electrodes. Different types of patterns can be obtained with suitable parameters. These parameters correspond to the electrical and environmental conditions during the breakdown. | en_US |
| dc.identifier.doi | 10.1103/PhysRevE.59.1540 | en_US |
| dc.identifier.issn | 1063-651X | en_US |
| dc.identifier.journal | PHYSICAL REVIEW E | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevE.59.1540 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/31528 | |
| dc.identifier.wosnumber | WOS:000078779500035 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Dielectric breakdown patterns and active walker model | en_US |
| dc.type | Article | en_US |