<link rel="stylesheet" href="styles.cf390c6bfbe7555f.css"> Skip to main content

Pentacene thin-film transistor with PVP-capped high-k MgO dielectric grown by reactive evaporation

Loading...
Thumbnail Image

Date

Journal Title

Journal ISSN

Volume Title

Publisher

DOI

10.1149/1.2844285

Abstract

Pentacene thin-film transistors operated at low voltages have been realized by employing hybrid dielectrics, poly(4-vinylphenol) (PVP)-capped MgO. The MgO film was deposited by reactive evaporation of magnesium in oxygen. The PVP layer plays a role in modifying the surface morphology of the MgO layer, and the images of atomic force microscopy for the PVP-capped MgO films show a root-mean-square roughness of 1 nm. The hybrid dielectric has a dielectric constant of 7.05 with a dielectric strength. The fabricated pentacene organic thin-film transistors exhibit a mobility of 0.66 cm(2)/V s, a threshold voltage of -2.67 V, and an on/off ratio of 10(3). (c) 2008 The Electrochemical Society.

Description

Keywords

Citation

Endorsement

Review

Supplemented By

Referenced By