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A NEW CONDUCTION MODEL FOR POLYCRYSTALLINE SILICON FILMS

dc.citation.epage98en_US
dc.citation.issue4en_US
dc.citation.spage95en_US
dc.citation.volume2en_US
dc.citation.woscount40
dc.contributor.authorLU, NCCen_US
dc.contributor.authorGERZBERG, Len_US
dc.contributor.authorLU, CYen_US
dc.contributor.authorMEINDL, JDen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:06:27Z
dc.date.available2014-12-08T15:06:27Z
dc.date.issued1981en_US
dc.identifier.issn0193-8576en_US
dc.identifier.journalELECTRON DEVICE LETTERSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/5029
dc.identifier.wosnumberWOS:A1981LT05200006
dc.language.isoen_USen_US
dc.titleA NEW CONDUCTION MODEL FOR POLYCRYSTALLINE SILICON FILMSen_US
dc.typeArticleen_US

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